Study of thermal expansion of mercury indium telluride crystals by XRD technique

作     者：王领航 介万奇 

作者机构：Electronic Materials Research LaboratoryKey Laboratory of Education MinistryXi'an Jiaotong University State Key Laboratory of Solidification ProcessingNorthwestern Polytechnical University 

出 版 物：《中国有色金属学会会刊：英文版》 (Transactions of Nonferrous Metals Society of China)

年 卷 期：2009年第19卷第S3期

页      面：776-779页

核心收录：

学科分类：081704[工学-应用化学] 07[理学] 08[工学] 0817[工学-化学工程与技术] 0703[理学-化学] 070301[理学-无机化学] 

基　　金：Project(2007AA03Z442) supported by the National High-tech Research and Development Program of China Project(20090451374) supported by China Postdoctoral Science Foundation 

主　　题：mercury indium telluride crystal growth XRD thermal expansion semiconductor material 

摘      要：The thermal expansion behavior of mercury indium telluride (MIT) crystals, Hg(3-3x)In2xTe3(x=0.5), based on X-ray diffraction experimental data is studied at 298-573 K. The variation of the lattice parameter of MIT crystals with temperature was determined and the thermal expansion coefficient was deduced to be 6.18×10-6 K-1. The results of the thermal expansion are fitted to polynomial expressions. It is found that the lattice parameter decreases quickly with temperature increasing at 298-330 K and then increases continuously up to 573 K. The minimum lattice parameter corresponds to a maximum shrinkage of 0.06%.