DEVELOPMENT OF COMMON WHEAT GERM-PLASM RESISTANT TO BARLEY YELLOW DWARF VIRUS BY BIOTECHNOLOGY
DEVELOPMENT OF COMMON WHEAT GERM-PLASM RESISTANT TO BARLEY YELLOW DWARF VIRUS BY BIOTECHNOLOGY作者机构:Institute of Crop Breeding and Cultivation GAAS Institute of Plant Protection GAAS CSIRODivision of Plant IndustryAustralia
出 版 物:《Science China Chemistry》 (中国科学(化学英文版))
年 卷 期:1991年第34卷第9期
页 面:1055-1062页
核心收录:
基 金:This research is supported by the Australian Centre for International Agricultural Research(Projects 8379 and 8813) by the National Science and Technology Committee of China on China's side
主 题:wheat yellow dwarf virus barley yellow dwarf virus Thinopyrum intermedium addition line translocation line cDNA probe.
摘 要:Barley yellow dwarf virus (BYDV) is one of the most serious wheat diseases in China. So far no resistance has been described in common wheat. A certain level of BYDV resistance was found in thirteen Triticeae species. Thinopyrum intermedium, two octoploids derived from TH. intermedium/wheat, Zhong 4 awnless and TAF46, and one disomic addition line, L1 derived from TAF46, showed good resistance to BYDV by enzyme linked immunosorbent assay (ELISA). Two wheat/TA. intermedium translocation lines, CPI 119880 and CPI 119899, showing good BYDV resistance were developed from L1 by using both CSph mutant and tissue culture. It is found that their BYDV resistance was controlled by a single dominant gene. Two cDNA probes pEleAcc3 and pPJN8 (E1-T1) were screened for detecting Th. intermedium DNA in wheat background. A specific band for the DNA of Th. intermedium and its derivatives was found in Southern hybridization. It is also possible to determine the size of the alien segment by comparing the relative density of the specific band. Therefore, this can be used as a marker to identify the BYDV resistance in wheat breeding program.