Piezoresponse force microscopy and dielectric spectroscopy study of Ba_(0.6)Sr_(0.4)TiO_(3)thin films
作者机构：Department of Materials Engineering and Welding Faculty of Mechanical Engineering Gdansk University of Technology 11/12Narutowicza St.Gdansk 80-233Poland
出 版 物：《Journal of Advanced Dielectrics》 (先进电介质学报（英文）)
年 卷 期：2019年第9卷第3期
页 面：29-35页
学科分类：0808[工学-电气工程] 0809[工学-电子科学与技术（可授工学、理学学位）] 0817[工学-化学工程与技术] 08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 0702[理学-物理学]
基 金：The present research was supported by National Science Centre Poland as a re-search project No.N50709831/2319
主 题：Thin film Ba_(0.6)Sr_(0.4)TiO_(3) crystal structure dielectric spectroscopy piezoresponse force microscopy
摘 要：Research on synthesis,characterization and determination of processing-structure-property relationships of commercially important ferroelectric thin films has been *** sol-gel type solution deposition technique was applied to produce good quality thin films of Ba_(0.6)Sr_(0.4)TiO_(3)(BST60/40)chemical composition on the stainless steel *** thin films were characterized in terms of their microstructure,crystal structure,phase composition,piezoelectric and dielectric *** was found that the BST60/40 thin film adopted the cubic structure at room temperature with an elementary cell parameter a-3:971e8TÅ.Morphology of the thin film surface was studied with Atomic Force Microscopy(AFM).Average roughness of the thin films surface was found(Sa=0:055μm).Piezoresponse Force Microscopy(PFM)was applied for the thin film *** piezoelectric regions were found in BST60/40 thin ***,dielectric response measured at room temperature was studied in assumption of piezoelectric electric equivalent circuit.
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