Observing charge separation in nanoantennas via ultrafast point-projection electron microscopy

作     者：Jan Vogelsang Germann Hergert Dong Wang Petra Groß Christoph Lienau 

作者机构：Carl von Ossietzky UniversitätInstitut für Physik and Center of Interface Science26129 OldenburgNiedersachsenGermany TU IlmenauInstitut für Werkstofftechnik und Institut für Mikro-und Nanotechnologien98693 IlmenauThüringenGermany Carl von Ossietzky UniversitätForschungszentrum Neurosensorik26129 OldenburgNiedersachsenGermany Department of PhysicsLund UniversityBox 11822100 LundSweden 

出 版 物：《Light(Science & Applications)》 (光（科学与应用)（英文版）)

年 卷 期：2018年第7卷第1期

页      面：532-539页

核心收录：

学科分类：070207[理学-光学] 07[理学] 08[工学] 0803[工学-光学工程] 0702[理学-物理学] 

基　　金：the Deutsche Forschungsgemeinschaft for support within the priority program QUTIF(SPP1840) support from SPP1839,the German-Israeli Foundation(GIF grant no.1256) the Korea Foundation for International Cooperation of Science and Technology(Global Research Laboratory project,K20815000003)is acknowledged the HPC Cluster CARL in Oldenburg(DFG INST 184/157-1 FUGG) the Studienstiftung des Deutschen Volkes for the personal grant 

主　　题：projection separation sized 

摘      要：Observing the motion of electrons on their natural nanometer length and femtosecond time scales is a fundamental goal of and an open challenge for contemporary ultrafast science1–*** present,optical techniques and electron microscopy mostly provide either ultrahigh temporal or spatial resolution,and microscopy techniques with combined space-time resolution require further development6–*** this study,we create an ultrafast electron source via plasmon nanofocusing on a sharp gold taper and implement this source in an ultrafast point-projection electron *** source is used in an optical pump—electron probe experiment to study ultrafast photoemissions from a nanometer-sized plasmonic antenna12–*** probe the real space motion of the photoemitted electrons with a 20-nm spatial resolution and a 25-fs time resolution and reveal the deflection of probe electrons by residual holes in the *** is a step toward time-resolved microscopy of electronic motion in nanostructures.