检索结果-南通市图书馆

A Cathodic Electrochromic Material Based on Thick Perylene Bisimide Film with High optical contrast and High Stability

引用

CCS Chemistry 2022年第4期4卷 1347-1356页

作者： Jianqiao Wang Weitao Ma Hailong Wang Zengqi Xie Huanhuan Zhang Yuguang Ma State Key Laboratory of Luminescent Materials and Devices Institute of Polymer Optoelectronic Materials and DevicesSouth China University of TechnologyTianhe DistrictGuangzhou 510640

Cathodic electrochromic materials realized by n-type doping of conducting polymers are scarce.Even with limited cases reported in the literature,long-term stability is an urgent problem to be solved.Herein,we report a high performance and stable cathodic electrochromic material,poly(Th-Cl-PBI),based on a perylene bisimide function core.Due to its high electropolymerization efficiency and low steric hindrance of thiophene groups,perylene bisimide,which generally does not dissolve and form film easily,can grow to the sufficient thickness of 350 nm for wide-range spectral modulation and large-capacity energy storage.The optical contrast of optimized film with a thickness of 240 nm reaches as high as 69.1% at 520 nm,94.1% at 760 nm,and 95.7% at 680 nm.Theoretical simulation based on the Lambert–Beer law also verifies this optical contrast dependent on film thickness.Besides,during the transition between the neutral state and radical anion state,it maintains 90.2% of the electrochemical activity after 4000 cycles,and the transmittance spectrum remains stable after 2000 cycles.The cation size effect on cathodic electrochromic process and cyclic stability has been investigated.

关键词： cathodic electrochromism perylene bisimide n-type doping film thickness optical contrast stability

来源：

维普期刊数据库评论

在线全文

维普期刊数据库

学校读者我要写书评

暂无评论

Rapidly counting atomic planes of ultra-thin MoSe2 nanosheets(1≤n≤4)on SiO2/Si substrate

引用

Rare Metals 2016年第8期35卷 632-636页

作者： Yi-Ping Wang Hui-Jun Zhou Gui-Hua Zhao Tian-Long Xia Lei Wang Le Wang Li-Yuan Zhang Department of Physics Renmin University of ChinaBeijing 100872China Beijing Key Laboratory of Opto-electronic Functional Materialsand Micro-nano Devices Renmin University of China Department of Power and Electrical Engineering Northwest A&F UniversityYangling 712100ShaanxiChina

The optical, thermal and electrical properties of ultra-thin two-dimensional （2D） crystal materials are highly related to their thickness. Therefore, identifying the atomic planes of few-layer crystal materials rapidly is crucial to fundamental study. Here, a simple technique was demonstrated based on optical contrast for counting atomic planes （n） of few-layer MoSe2 on SiO2/Si substrates. It is found that the optical contrast of single-layer MoSe2 depends on light wavelength and thickness of SiO2 on Si substrate. The data calculated based on a Fresnel law-based model as well as atomic force microscopy （AFM） mea- surements fit well with the values measured by spectro- scopic ellipsometer. Furthermore, the calculated and measured contrasts were integral and plotted, which can be used to determine the MoSe2 atomic planes （1 ≤ n ≤ 4） accurately and rapidly.

关键词： Thickness identification optical contrast MoSe2 optical microscopy

来源：

维普期刊数据库

同方期刊数据库评论

在线全文

学校读者我要写书评

暂无评论

Rapid identification of two-dimensional materials via machine learning assisted optic microscopy

引用

Journal of Materiomics 2019年第3期5卷 413-421页

作者： Yuhao Li Yangyang Kong Jinlin Peng Chuanbin Yu Zhi Li Penghui Li Yunya Liu Cun-Fa Gao Rong Wu Shenzhen Key Laboratory of Nanobiomechanics Shenzhen Institute of Advanced TechnologyChinese Academy of SciencesShenzhen518055GuangdongChina School of Physics Science and Technology Xinjiang UniversityUrumqi830046XinjiangChina State Key Laboratory of Mechanics and Control of Mechanical Structures Nanjing University of Aeronautics&AstronauticsNanjing210016JiangsuChina Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education Xiangtan UniversityXiangtan411105HunanChina Institute of Biomedicine and Biotechnology Shenzhen Institute of Advanced TechnologyChinese Academy of SciencesShenzhen518055GuangdongChina

A combination of Fresnel law and machine learning method is proposed to identify the layer counts of 2D materials.Three indexes,which are optical contrast,red-green-blue,total color difference,are presented to illustrate and simulate the visibility of 2D materials on Si/SiO_(2) substrate,and the machine learning algorithms,which are k-mean clustering and k-nearest neighbors,are employed to obtain thickness database of 2D material and test the optical images of 2D materials via red-green-blue index.The results show that this method can provide fast,accurate and large-area property of 2D material.With the combination of artificial intelligence and nanoscience,this machine learning assisted method eases the workload and promotes fundamental research of 2D materials.

关键词： Two-dimensional materials optical contrast Total color difference Red-green-blue K-means clustering K-nearest neighbors(k-NN)

来源：

维普期刊数据库评论

在线全文

维普期刊数据库

学校读者我要写书评

暂无评论

欢迎您,

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

在线全文

在线全文

在线全文

请选择保存的检索档案：

请选择收藏分类：

通借通还

欢迎您,

建议与咨询 留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

在线全文

在线全文

在线全文

请选择保存的检索档案： 新增检索档案 确定 取消

请选择收藏分类： 新增自定义分类 确定 取消

通借通还

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

请选择保存的检索档案：

请选择收藏分类：