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machine allocation in Semiconductor Wafer Fabrication Systems:A Simulation-Based Approach

Journal of Systems Science and Systems Engineering 2023年第3期32卷 372-390页

作者： Yanfeng Wu Sihua Chen School of Finance Jjiangxi University of Finance and EconomicsNanchang 330013China School of Information Management Jiangxi University of Finance and EconomicsNanchang 330032China

The problem of maximizing the throughput of Semiconductor Wafer Fabrication Systems is *** model the fabrication systems as a Stochastic Timed Automata and design a discrete-event simulation *** simulation scheme is explicit,fast and achieves high fidelity which captures the feature of reentrant process flow and is flexible to accommodate diversified wafer lot scheduling policies.A series of Marginal machine allocation Algorithms are proposed to sequentially allocate *** experiments suggest the designed methods are efficient to find good allocation solutions.

关键词： Semiconductor wafer fabrication system machine allocation discrete-event simulation marginal machine allocation

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A Discrete Multi‑Objective Artificial Bee Colony Algorithm for a Real‑World Electronic Device Testing machine allocation Problem

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Chinese Journal of Mechanical Engineering 2022年第6期35卷 136-150页

作者： Jin Xie Xinyu Li Liang Gao State Key Laboratory of Digital Manufacturing Equipment and Technology Huazhong University of Science and TechnologyWuhan 430074China

With the continuous development of science and technology,electronic devices have begun to enter all aspects of human life,becoming increasingly closely related to human *** have higher quality requirements for electronic *** device testing has gradually become an irreplaceable engineering process in modern manufacturing enterprises to guarantee the quality of products while preventing inferior products from entering the *** the large output of electronic devices,improving the testing efficiency while reducing the testing cost has become an urgent problem to be *** study investigates the electronic device testing machine allocation problem(EDTMAP),aiming to improve the production of electronic devices and reduce the scheduling distance among testing machines through reasonable machine ***,a mathematical model was formulated for the EDTMAP to maximize both production and the scheduling distance among testing ***,we developed a discrete multi-objective artificial bee colony(DMOABC)algorithm to solve EDTMAP.A crossover operator and local search operator were designed to improve the exploration and exploitation of the algorithm,*** experiments were conducted to evaluate the performance of the proposed *** experimental results demonstrate the superiority of the proposed algorithm compared with the non-dominated sorting genetic algorithm II(NSGA-II)and strength Pareto evolutionary algorithm 2(SPEA2).Finally,the mathematical model and DMOABC algorithm were applied to a real-world factory that tests radio-frequency *** results verify that our method can significantly improve production and reduce the scheduling distance among testing machines.

关键词： Electronic device machine allocation Multi-objective optimization Artificial bee colony algorithm

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