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thin film Assembly of Gold Nanoparticles for Vapor Sensing via Droplet Interfacial Reaction

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Journal of Materials Science & Technology 2013年第5期29卷 401-405页

作者： Kun Luo Tao Huang Yujia Luo Haiming Wang Chao Sang Xiaogang Li Key Laboratory of New Processing Technology for Nonferrous Metals & Materials Ministry of EducationCollege of Materials Science and EngineeringGuilin University of Technology China Medical University Shenbei New District

A facile approach to prepare a thin film vapor sensor is demonstrated through droplet interracial reaction on an IDA microelectrode. Scanning electron microscopy, atomic force microscopy and transmission electron microscopy analyses show that the film of the vapor sensor is composed of self-assembled gold nanocrystals in an average diameter of about 4.3 nm. The as-prepared sensor was examined by potential step method and impedance measurement, which exhibited significant △R/Ri responses and excellent cycle performance to the volatile organic compound （VOC） vapors of acetone, methanol, styrene, benzene, toluene and ethanol. The selectivity to the VOCs with benzene ring or organic solvents suggests that the sensor is probably in line with the swelling and dielectric sensing mechanisms.

关键词： Gold nanoparticle thin film Self-assembly Droplet interfacial reaction Vapor sensor

thin film of Perovskite Oxide with Atomic Scale p-n Junctions

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Chemical Research in Chinese Universities 2012年第3期28卷 379-381页

作者： HU Bin HUANG Ke-ke HOU Chang-min YUAN Hong-ming PANG Guang-sheng FENG Shou-hua State Key Laboratory of Inorganic Synthesis and Preparative Chemistry College of ChemistryJilin UniversityChangchun 130012P.R.China

thin films of perovskite manganese oxide Lao.66Ca0.29K0.05MnO3（LCKMO） on Au/ITO（ITO=indium tin oxide） substrates were prepared by off-axis radio frequency magnetron sputtering and characterized by X-ray diffrac- tion（XRD）, high-resolution transmission electron microscopy（HRTEM）, and conductive atomic force microscopy （C-AFM） at room temperature. The thin films with thickness ranged from 100 nm to 300 nm basically show cubic structures with a=0.3886 nm, the same as that of the raw material used, but the structures are highly modulated. C-AFM results revealed that the atomic scale p-n junction feature of the thin films was the same as that of the single crystals. The preparation of the thin films thus further confirms the possibility of their application extending from micrometer-sized single crystals to macroscopic thin film.

关键词： Perovskite oxide thin film Atomic scale p-n junction

Compatibility and optoelectronic of ZnSe nano crystalline thin film

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Chinese Physics B 2012年第9期21卷 460-465页

作者： Taj Muhammad Khan Tayyaba BiBi National Institute of Laser and Optronics(NILOP) Department of Chemistry Peshawar University

We report the room temperature synthesis of zinc selenide （ZnSe） nano crystalline thin film on quartz by using a relatively simple and low cost closed space sublimation process （CSSP）. The compatibility of the prepared thin films for optoelectronic applications was assessed by X-ray diffraction （XRD）, atomic force microscope （AFM）, scanning electron microscope （SEM）, Raman spectroscopy, photoluminescence, and Fourier transform infrared spectroscopy （FT-IR）. The XRD confirmed that the films were polycrystalline with the preferential orientation along the （111） plane corresponding to the cubic phase （2θ = 27.28°）. The AFM indicated that the ZnSe film presented a smooth and compact morphology with RMS roughness 19.86 nm. The longitudinal optical phonon modes were observed at 247 cm^-1 and 490 cm^-1 attributed to the cubic structured ZnSe. The Zn-Se stretching band was confirmed by the FT-IR. The microstructure and compositional analysis was made with the SEM. The grain size, dislocation density, and strain calculated were co-related. All these properties manifested a good quality, high stability, finely adhesive, and closely packed structured ZnSe thin film for optoelectronic applications.

关键词： thin film Raman spectroscopy

Feasibility of wear reduction for soft nanostructured thin film through enhanced elastic recoverability and contact stress relief

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Friction 2023年第7期11卷 1292-1306页

作者： Kuk-Jin SEO Hyun-Joon KIM Dae-Eun KIM Department of Mechanical Engineering Yonsei UniversitySeoul 03722Republic of Korea Department of Precision Mechanical Engineering Kyungpook National UniversitySangju 37224Republic of Korea Department of Advanced Science and Technology Convergence Kyungpook National UniversitySangju 37224Republic of Korea

This work shows that a soft,thin film comprising randomly aligned carbon nanotubes(CNTs)can reduce surface wear more effectively than a homogeneous thin film because of enhanced elastic recoverability and contact stress relief originating from its mesh *** investigate the wear characteristics of the mesh structure compared to those of the homogeneous thin film,multi-walled CNTs(MWCNTs)and diamond-like carbon(DLC)thin films were prepared to conduct nanoscale tribological experiments using the atomic force microscopy(AFM).The MWCNT thin film showed unmeasurably low wear compared with the DLC thin film under a certain range of normal *** demonstrate the wear reduction mechanism of the MWCNT thin film,its indentation and frictional behaviors were *** indentation behavior of the MWCNT thin film revealed repetitive elastic deformation with a wide strain range and a significantly lower elastic modulus than that of the DLC thin *** permanent deformation of the MWCNT thin film was observed through frictional experiments under relatively high normal load *** results are expected to provide insights into the design of highly wear-resistant surfaces using nanostructures.

关键词： carbon nanotube(CNT) thin film wear friction elastic recovery

Optical and Microstructural Characterisations of Pulsed rf Magnetron Sputtered Alumina thin film

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Journal of Materials Science & Technology 2013年第10期29卷 929-936页

作者： I.Neelakanta Reddy V.Rajagopal Reddy N.Sridhara S.Basavaraja A.K.Sharma Arjun Dey Thermal Systems Group ISRO Satellite CentreVimanapura Post Department of Physics Sri Venkateswara University Bruker India Nanotechnology Laboratory Jawaharlal Nehru Centre for Advanced Scientifc Research (JNCASR)

Alumina thin films were deposited on fused quartz and SS304 substrate by pulsed rf magnetron sputtering with both direct and reactive methods. The films were characterised by energy dispersive X-ray spectroscopy, X-ray diffraction, scanning electron microscopy, field emission scanning electron microscopy and atomic force microscopy to reveal the microstructure, surface morphology and topography of thin films. Transmittance and reflectance of alumina thin film were evaluated after deposition on the quartz substrate. Transmittance of the quartz remains almost un-altered when alumina was deposited by the reactive sputtering. A marginal decrease of ~4% in the transmittance of quartz was, however, observed after deposition of alumina by direct sputtering. Infrared emittance of the substrate also remains almost constant after deposition of thin alumina film. Further, as-deposited alumina on SS304 obtained by both direct and reactive sputtering process was amorphous in nature. However, after annealing crystalline peaks were observed.

关键词： Alumina thin film rf magnetron sputtering Microstructure Transmittance Reflectance Infrared emissivity

An investigation of an Emden-Fowler equation from thin film flow

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Acta Mechanica Sinica 2012年第2期28卷 300-307页

作者： Ebrahim Momoniat Centre for Differential Equations Continuum Mechanics and ApplicationsSchool of Computational and Applied MathematicsUniversity of the WitwatersrandJohannesburgPrivate Bag 3Wits 2050South Africa

A third-order ordinary differential equation （ODE） for thin film flow with both Neumann and Dirichlet bound- ary conditions is transformed into a second-order nonlinear ODE with Dirichlet boundary conditions. Numerical solu- tions of the nonlinear second-order ODE are investigated us- ing finite difference schemes. A finite difference formulation to an Emden-Fowler representation of the second-order non- linear ODE is shown to converge faster than a finite differ- ence formulation of the standard form of the second-order nonlinear ODE. Both finite difference schemes satisfy the von Neumann stability criteria. When mapping the numeri- cal solution of the second-order ODE back to the variables of the original third-order ODE we recover the position of the contact line. A nonlinear relationship between the position of the contact line and physical parameters is obtained.

关键词： thin film Third-order ODE Emden-Fowler equation Finite differences Contact angle

Influence of Annealing on X-Ray Radiation Sensing Properties of TiO2 thin film

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Photonic Sensors 2018年第1期8卷 70-79页

作者： M. P. SARMA J. M. KALITA G. WARY Department of Physics Cotton University Guwahati 781001 India Department of Physics and Electronics Rhodes University P. O. Box 94 Grahamstown 6140 South Africa

A recent study shows that the titanium dioxide （TiO2） thin film synthesised by a chemical bath deposition technique is a very useful material for the X-ray radiation sensor. In this work, we reported the influence of annealing on the X-ray radiation detection sensitivity of the TiO2 film. The films were annealed at 333 K, 363K, 393K, 473 K, and 573K for 1 hour. Structural analyses showed that the microstrain and dislocation density decreased whereas the average crystallite size increased with annealing. The band gap of the films also decreased from 3.26eV to 3.10eV after annealing. The I-V characteristics record under the dark condition and under the X-ray irradiation showed that the conductivity increased with annealing. The influence of annealing on the detection sensitivity was negligible if the bias voltage applied across the films was low （within 0.2V - 1.0V）. At higher bias voltage （〉1.0V）, the contribution of electrons excited by X-ray became less significant which affected the detection sensitivity.

关键词： Titanium dioxide (TiO2) thin film annealing X-ray sensor

Experimental study on microdeposition of the copper thin film by femtosecond laser-induced forward transfer

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Chinese Physics B 2009年第10期18卷 4292-4297页

作者：杨丽王清月 Civil Aviation University of China Ultrafast Laser Laboratory School of Precision Instruments and Optoelectronics Engineering Tianjin University and Laboratory of Optoelectronic Information Technical Science EMC

The morphologies of the deposited dots on the 40 nm-thick copper film by the femtosecond laser-induced forward transfer that depend on the irradiated laser fluence have been studied, and the variations of orderliness of the diameter of deposited dots on the quartz substrate and forward ablated dot on the donor substrate with increasing pulse fluence have been obtained experimentally. The experimental results show that a thinner copper film would generate larger-sized ablated dot and deposited dot at the threshold fluence for transfer. By x-ray diffraction measurement, it is demonstrated that the crystal form of the transferred copper films is unaltered and the size of the crystallites is diminished.

关键词： femtosecond laser laser-induced forward transfer thin film ablation deposition

The Mexican hat effect on the delamination buckling of a compressed thin film

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Acta Mechanica Sinica 2014年第6期30卷 927-932页

作者： Yin Zhang Yun Liu State Key Laboratory of Nonlinear Mechanics (LNM) Institute of Mechanics Chinese Academy of Sciences Faculty of Information and Automation Kunming University of Science and Technology

Because of the interaction between film and substrate,the film buckling stress can vary significantly,depending on the delamination geometry,the film and substrate mechanical *** Mexican hat effect indicates such *** analytical method is presented,and related dimensional analysis shows that a single dimensionless parameter can effectively evaluate the effect.

关键词： Buckling Delamination Elastic foundation thin film Compliant substrate