The Mexican hat effect on the delamination buckling of a compressed thin film

作     者：Yin Zhang Yun Liu 

作者机构：State Key Laboratory of Nonlinear Mechanics (LNM)Institute of Mechanics Chinese Academy of Sciences Faculty of Information and AutomationKunming University of Science and Technology 

出 版 物：《Acta Mechanica Sinica》 (力学学报（英文版）)

年 卷 期：2014年第30卷第6期

页      面：927-932页

核心收录：

学科分类：08[工学] 0802[工学-机械工程] 0701[理学-数学] 0801[工学-力学（可授工学、理学学位）] 0702[理学-物理学] 080102[工学-固体力学] 

基　　金：supported by the National Natural Science Foundation of China(11023001 and 11372321) 

主　　题：Buckling Delamination Elastic foundation Thin film Compliant substrate 

摘      要：Because of the interaction between film and substrate,the film buckling stress can vary significantly,depending on the delamination geometry,the film and substrate mechanical *** Mexican hat effect indicates such *** analytical method is presented,and related dimensional analysis shows that a single dimensionless parameter can effectively evaluate the effect.