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检索条件"主题词=Deterministic test cubes"
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Research Progress in Generating deterministic test cubes on Chip for Scan BIST
Research Progress in Generating Deterministic Test Cubes on ...
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ICEMI'2005第七届国际电子测量与仪器学术会议
作者: Yi Maoxiang Mao Jianbo Liang Huaguo (Hefei University of Technology Hefei 230009 China)
Mixed scan BIST is an effective scheme for testing the increasing complexity of system chips. It is highly important for this scheme that deterministic test cubes used to detect the random pattern res
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