Research Progress in Generating Deterministic Test Cubes on Chip for Scan BIST
会议名称：《ICEMI'2005第七届国际电子测量与仪器学术会议》
会议日期：2005年
学科分类：080903[工学-微电子学与固体电子学] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学]
基 金：This work was supported by NSFC under grantsNo.60444001 and No.90407008
关 键 词：Deterministic test cubes mixed scan BIST LFSR bit-altering.
摘 要：Mixed scan BIST is an effective scheme for testing the increasing complexity of system chips. It is highly important for this scheme that deterministic test cubes used to detect the random pattern res