This paper is an introduction to mesh based generated reluctance network modeling using triangular *** contributions on mesh based generated reluctance networks using rectangular shaped elements have been published,bu...
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This paper is an introduction to mesh based generated reluctance network modeling using triangular *** contributions on mesh based generated reluctance networks using rectangular shaped elements have been published,but very few on those generated from a mesh using triangular *** use of triangular elements is aimed at extending the application of the approach to any shape of modeled *** concepts of the approach are presented in the case of electromagnetic *** procedure for coding the approach in the case of a flat linear permanent magnet machine is *** developed under MATLAB environment are also included.
This paper is an introduction to mesh based generated reluctance network *** overview of scientific works which led to the development of this approach is first *** concepts of the approach are then presented in the c...
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This paper is an introduction to mesh based generated reluctance network *** overview of scientific works which led to the development of this approach is first *** concepts of the approach are then presented in the case of electromagnetic devices.A step-by-step procedure for coding the approach in the case of a flat linear permanent magnet machine is *** developed under MATLAB and Scilab environments are also included.
Polycrystalline zinc oxide (ZnO) thin films have been deposited at 450°C onto glass and silicon substrates by pulsed laser deposition technique (PLD). The used source was a KrF excimer laser (248 nm, 25 ns, 5 Hz, 2 J...
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Polycrystalline zinc oxide (ZnO) thin films have been deposited at 450°C onto glass and silicon substrates by pulsed laser deposition technique (PLD). The used source was a KrF excimer laser (248 nm, 25 ns, 5 Hz, 2 J/cm2). The effects of glass and silicon substrates on structural and optical properties of ZnO films have been investigated. X-ray diffraction patterns showed that ZnO films are polycrystalline with a hexagonal wurtzite—type structure with a strong (103) orientation and have a good crystallinity on monocrystalline Si(100) substrate. The thickness and compositional depth profile were studied by Rutherford Backscattering spectrometry (RBS). The average transmittance of ZnO films deposited on glass substrate in the visible range is 70%.
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