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Nonlinear quantum spectroscopy with parity-time-symmetric integrated circuits

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Photonics Research 2022年第7期10卷 1763-1776页

作者： PAWAN KUMAR SINA SARAVI thomas pertsch FRANK SETZPFANDT ANDREY A.SUKHORUKOV Institute of Applied Physics Abbe Center of PhotonicsFriedrich Schiller University Jena07745 JenaGermany Fraunhofer Institute for Applied Optics and Precision Engineering 07745 JenaGermany Research School of Physics Australian National UniversityCanberraACT 2601Australia ARC Centre of Excellence for Transformative Meta-Optical Systems(TMOS) Australia

We propose a novel quantum nonlinear interferometer design that incorporates a passive parity-time(PT)-symmetric coupler sandwiched between two nonlinear sections where signal-idler photon pairs are generated.The PT symmetry enables efficient coupling of the longer-wavelength idler photons and facilitates the sensing of losses in the second waveguide exposed to analyte under investigation,whose absorption can be inferred by measuring only the signal intensity at a shorter wavelength where efficient detectors are readily available.Remarkably,we identify a new phenomenon of sharp signal intensity fringe shift at critical idler loss values,which is distinct from the previously studied PT symmetry breaking.We discuss how such unconventional properties arising from quantum interference can provide a route to enhancing the sensing of analytes and facilitate broadband spectroscopy applications in integrated photonic platforms.

关键词： interferometer waveguide quantum

Material-specific high-resolution table-top extreme ultraviolet microscopy

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Light(Science & Applications) 2022年第5期11卷 991-1000页

作者： Wilhelm Eschen Lars Loetgering Vittoria Schuster Robert Klas Alexander Kirsche Lutz Berthold Michael Steinert thomas pertsch Herbert Gross Michael Krause Jens Limpert Jan Rothhardt Institute of Applied Physics Abbe Center of PhotonicsFriedrich-SchillerUniversität JenaAlbert-Einstein-Str.1507745 JenaGermany HelmholtzInstitute Jena Fröbelstieg 307743 JenaGermany Leibniz Institute of Photonic Technology Albert-Einstein-Straße 907745 JenaGermany Fraunhofer Institute for Microstructure of Materials and Systems IMWS WalterHülse-Str.106120 HalleGermany Fraunhofer Institute for Applied Optics and Precision Engineering IOF Albert-Einstein-Str.707745 JenaGermany

Microscopy with extreme ultraviolet(EUV)radiation holds promise for high-resolution imaging with excellent material contrast,due to the short wavelength and numerous element-specific absorption edges available in this spectral range.At the same time,EUV radiation has significantly larger penetration depths than electrons.It thus enables a nano-scale view into complex three-dimensional structures that are important for material science,semiconductor metrology,and next-generation nano-devices.Here,we present high-resolution and material-specific microscopy at 13.5 nm wavelength.We combine a highly stable,high photon-flux,table-top EUV source with an interferometrically stabilized ptychography setup.By utilizing structured EUV illumination,we overcome the limitations of conventional EUV focusing optics and demonstrate high-resolution microscopy at a half-pitch lateral resolution of 16 nm.Moreover,we propose mixed-state orthogonal probe relaxation ptychography,enabling robust phase-contrast imaging over wide fields of view and long acquisition times.In this way,the complex transmission of an integrated circuit is precisely reconstructed,allowing for the classification of the material composition of mesoscopic semiconductor systems.

关键词： resolution ultraviolet extreme

Spatially engineered nonlinearity in resonant metasurfaces

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Photonics Research 2023年第2期11卷 252-259页

作者： ANNA FEDOTOVA MOHAMMADREZA YOUNESI MAXIMILIAN WEISSFLOG DENNIS ARSLAN thomas pertsch ISABELLE STAUDE FRANK SETZPFANDT Institute of Solid State Physics Friedrich Schiller University Jena07743 JenaGermany Institute of Applied Physics Abbe Center of PhotonicsFriedrich Schiller University Jena07745 JenaGermany Max Planck School of Photonics 07745 JenaGermany Fraunhofer Institute for Applied Optics and Precision Engineering 07745 JenaGermany

Spatial engineering of the nonlinear susceptibility χ^((2)) in resonant metasurfaces offers a new degree of freedom in the design of the far-field response of second-harmonic generation(SHG). We demonstrate this by applying electric field poling to lithium niobate(LN) thin films, which inverts the spontaneous polarization and thus the sign of χ^((2)). Metasurfaces fabricated in periodically poled LN films reveal the distinct influence of theχ^((2))-patterning on the spatial distribution of the second harmonic. This work is a first step toward far-field engineering of SHG in metasurfaces with electric field poling.

关键词： resonant surfaces harmonic

Near-field launching and mapping unidirectional surface plasmon polaritons using an automated dual-tip scanning near-field optical microscope

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Photonics Research 2022年第11期10卷 2628-2641页

作者： NAJMEH ABBASIRAD ANGELA BARREDA YI-JU CHEN JER-SHING HUANG ISABELLE STAUDE FRANK SETZPFANDT thomas pertsch Institute of Applied Physics Abbe Center of PhotonicsFriedrich Schiller University Jena07745 JenaGermany Institute of Solid State Physics Friedrich Schiller University Jena07743 JenaGermany Research Department of Nanooptics Leibniz Institute of Photonic Technology07745 JenaGermany Fraunhofer-Institute for Applied Optics and Precision Engineering IOF 07745 JenaGermany

The spatial distribution of electromagnetic fields emitted from the aperture tip of a scanning near-field optical microscope(SNOM), which is called the emission pattern, depends on the geometry of the apex and the material composition of the tip’s coating. In previous works, experimental measurements of the emission pattern from the aperture tip were performed mostly in the far field. Moreover, the corresponding theoretical models were also developed based on these far-field measurements. Here, we have used the automated dual-tip SNOM to systematically characterize the emission from the aperture tip in the near field. In this regard, we have considered three different pairs of excitation and detection tips with distinct geometries. The emission patterns of the excitation tips were mapped using detection tips. Unidirectional surface plasmon polaritons(SPPs) at the surface of a gold platelet were launched by an excitation tip and measured in the near field by the detection tip. The experimental results were numerically reproduced by means of the Bethe–Bouwkamp model. This work puts into evidence the applicability of the automated dual-tip SNOM as the only available characterization technique to measure the emission from aperture tips in the near field. The reported asymmetric SPP radiation patterns can find applications in photonic integrated circuits or in biological and chemical sensing.

关键词： optical excitation field

Dielectric metasurfaces for distance measurements and three-dimensional imaging

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Advanced Photonics 2019年第3期1卷 20-28页

作者： Chunqi Jin Mina Afsharnia RenéBerlich Stefan Fasold Chengjun Zou Dennis Arslan Isabelle Staude thomas pertsch Frank Setzpfandt Friedrich Schiller University Jena Institute of Applied PhysicsAbbe Center of PhotonicsJenaGermany Chinese Academy of Sciences Changchun Institute of OpticsFine Mechanics and PhysicsChangchunChina University of the Chinese Academy of Sciences BeijingChina Fraunhofer Institute for Applied Optics and Precision Engineering JenaGermany

Ultrathin metasurfaces have shown the capability to influence all aspects of light propagation.This has made them promising options for replacing conventional bulky imaging optics while adding advantageous optical properties or functionalities.We demonstrate that such metasurfaces can also be applied for single-lens three-dimensional(3-D)imaging based on a specifically engineered point-spread function(PSF).Using Huygens’metasurfaces with high transmission,we design and realize a phase mask that implements a rotating PSF for 3-D imaging.We experimentally characterize the properties of the realized double-helix PSF,finding that it can uniquely encode object distances within a wide range.Furthermore,we experimentally demonstrate wide-field depth retrieval within a 3-D scene,showing the suitability of metasurfaces to realize optics for 3-D imaging,using just a single camera and lens system.

关键词： optics nanophotonics metasurfaces Mie-resonances three-dimensional imaging point-spread function engineering

Tailoring the properties of optical metamaterials

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中国光学与应用光学 2010年第1期3卷 1-10页

作者： Christian Helgert thomas pertsch Carsten Rockstuhl Ekaterina Pshenay-Severin Christoph Menzel Ernst-Bernhard Kley Arkadi Chipouline Christoph Etrich Uwe Huebner Andreas Tuennermann Falk Lederer ZIK ＂ultra-optics＂ Institute of Applied Physics Friedrich Schiller University .lena Max- Wien-Platz 1 07743 Jena Germany Institute of Condensed Matter Theory and Solid State Optics Friedrich Schiller University Jena Max-Wien-Platz 1 07743 Jena Germany Institute of Photonic Technology Albert-Einstein-Str. 9 07745 .lena Germany Fraunhofer Institute of Applied Optics and Precision Engineering Albert-Einstein-Str. 707745 Jena Germany

In this contribution we review our latest achievements of combined experimental and theoretical studies to tailor the properties of optical metamaterials(MMs) at will. We give three examples of metamaterial designs that have been realized by means of electron-beam lithography and whose spectroscopic characteristics have been comprehensively investigated. In every case, our experiments are complemented by rigorous numerical simulations. Particular emphasis is put on the significance of such tailored effective properties of optical MMs.

关键词：光学材料材料性能物理性能光谱特征