High Resolution Scanning Probe Microscopy and its Application for Polymers
作者单位：JST/Advanced Measurement and Analysis（SENTAN） Shimadzu CorporationJapan
会议名称：《2016年全国高分子材料科学与工程研讨会》
会议日期：2016年
学科分类：08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 0803[工学-光学工程]
摘 要：正*** Resolution Scanning Probe Microscopy The scanning probe microscopy is a powerful method for imaging topography of solids and also for observing material properties on *** on an industry-university cooperation,we have developed a frequency-modulation atomic force microscope（FM-AFM）compatible with advanced applications in viscous environments,as shown in *** atomic/molecular resolution was achieved even in liquids as shown with an example of ***（PE）molecules