Studying the fine microstructure of the passive film on nanocrystalline 304 stainless steel by EIS,XPS and AFM
作者单位：School of Materials Science and EngineeringSouth China University of Technology School of Mechanical and Automotive EngineeringSouth China University of Technology
会议名称：《2014年全国腐蚀电化学及测试方法学术交流会》
会议日期：2014年
学科分类：08[工学] 080502[工学-材料学] 0805[工学-材料科学与工程（可授工学、理学学位）]
基 金：financially supported by the National Natural Science Foundation of China(NSFC)under grant No.50871041 the Fundamental Research Funds for the Central Universities under grant No.20112M0064 the Key Laboratory of Clean Energy Materials of Guangdong Higher Education Institute under grant No.KLB11003
摘 要：The fine microstructure of the passive films on nanocrystalline(NC)and coarse crystalline(CC)304 stainless steels(SSs)in 0.5 M HSO were investigated by electrochemical impedance spectroscopy(EIS),X-ray photoelectron spectroscopy(XPS)and atomic force microscopy(AFM).The results indicate that the passive film on both CC and NC SSs exhibits a two-layer microstructure consisting of a compact inner layer and a porous