HIGH RESOLUTION ELECTRON MTCROSCOPIC STUDIES AT THE INSTITUTE OF METAL RESEARCH,ACADEMIA SINICA
会议名称：《The Second Chinese-Japanese Electron Microscopy Seminar》
会议日期：1985年
学科分类：08[工学] 080502[工学-材料学] 0805[工学-材料科学与工程（可授工学、理学学位）]
摘 要：正Since the installation of a JEM 200CX electron micro- scope equipped with a top-entry high resolution stage with a Scherzer resolution of 0.25 nm in the Institute of Metal *** Sinica,in 1982,high resolution elec- tron microscopic（HREM）studies,varying from metallic