In Situ Synchrotron X-ray Diffraction Studies of Single-walled Carbon Nanotubes for Electric Double-layer Capacitors
In Situ Synchrotron X-ray Diffraction Studies of Single-walled Carbon Nanotubes for Electric Double-layer Capacitors作者机构:Nagoya Institute of Technology Gokiso Showa Nagoya Aichi 4668555 Japan.
出 版 物:《Journal of Chemistry and Chemical Engineering》 (化学与化工(英文版))
年 卷 期:2015年第9卷第8期
页 面:509-513页
学科分类:081704[工学-应用化学] 07[理学] 08[工学] 0817[工学-化学工程与技术] 080502[工学-材料学] 0805[工学-材料科学与工程(可授工学、理学学位)] 0703[理学-化学] 070301[理学-无机化学]
主 题:Carbon nanotubes synchrotron X-ray EDLC
摘 要:In situ synchrotron X-ray diffraction experiments of SWCNT (single-walled carbon nanotube) electrode in alkali halide aqueous electrolyte at several applied potentials were performed, and the change in the diffraction pattern of SWCNTs was observed. It was found that the position of the 100 diffraction peak does not change with applied potential while the peak intensity decreases with anion adsorption. It was concluded that the space inside the tube would be the important ion adsorption site for the well-gown SWCNT bundles.