Finite element analysis of temperature and residual stress profiles of porous cubic Ti-6Al-4V titanium alloy by electron beam melting

作     者：Xiaochun He Yang Li Yongjie Bi Xiaomei Liu Bing Zhou Shangzhou Zhang Shujun Li Xiaochun He;Yang Li;Yongjie Bi;Xiaomei Liu;Bing Zhou;Shangzhou Zhang;Shujun Li

作者机构：School of Nuclear Equipment and Nuclear EngineeringYantai UniversityYantai 264005China Institute of Metal ResearchChinese Academy of SciencesShenyang 110016China 

出 版 物：《Journal of Materials Science & Technology》 (材料科学技术（英文版）)

年 卷 期：2020年第44卷第9期

页      面：191-200页

核心收录：

学科分类：07[理学] 0806[工学-冶金工程] 0817[工学-化学工程与技术] 08[工学] 070104[理学-应用数学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 0703[理学-化学] 0802[工学-机械工程] 0701[理学-数学] 0702[理学-物理学] 0801[工学-力学（可授工学、理学学位）] 

基　　金：The work was financially supported by the Natural Science Foundation of Shandong Province,China(No.ZR2019MEM012) the Major Scientific and Technological Innovation Program of Shandong Province,China(No.2019JZZY010325) the Key Research Program of Frontier Sciences,CAS(No.QYZDJ-SSW-JSC031-02) the National Natural Science Foundation of China(No.51871220) 

主　　题：Electron beam melting Ti-6Al-4V titanium alloy Porous cubic grids Finite element analysis Temperature field Stress field 

摘      要：The temperature and stress profiles of porous cubic Ti-6Al-4V titanium alloy grids by additive manufacturing via electron beam melting(EBM)based on finite element(FE)method were ***-dimensional FE models were developed to simulate the single-layer and five-layer girds under annular and lateral *** results showed that the molten pool temperature in five-layer girds was higher than that in single-layer grids owing to the larger mass and higher heat *** energies accumulated by the longer scanning time for annular path than lateral path led to the higher temperature and steeper temperature *** thermal stress drastically fluctuated during EBM process and the residual stress decreased with the increase of powder layer where the largest stress appeared at the first layer along the build *** stress under lateral scanning was slightly larger but relatively more homogeneous distribution than those under annular *** stress distribution showed anisotropy and the maximum Von Mises stress occurred around the central *** stress profiles were explained by the temperature fields and grids structure.