Chemical Solution Deposition of YBa2Cu3O7 Films on YSZ （100） Substrates

作     者：Henry Elías Sanchez Comejo Angel Bustamante Dominguez1 Ana María Osorio Luis De Los Santos Valladares José Albino Aguiar Crispin H. W. Barnes 

作者机构：Ceramics and Nanomaterials Laboratory Department of Physics Major National University of San Marcos Lima 14-0149 Peru Department of Chemistry and Chemical Engineering Major National University of San Marcos Lima 14-0149 Peru Superconductivity and Advanced Materials Laboratory Department of Physics Federal University of Pernambuco Recife50670-901 Brazil Cavendish Laboratory Department of Physics University of Cambridge Cambridge CB3 0HE United Kingdom 

出 版 物：《Journal of Chemistry and Chemical Engineering》 (化学与化工（英文版）)

年 卷 期：2014年第8卷第6期

页      面：547-551页

学科分类：081704[工学-应用化学] 07[理学] 070304[理学-物理化学(含∶化学物理)] 08[工学] 0817[工学-化学工程与技术] 080502[工学-材料学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0703[理学-化学] 

主　　题：Sol-gel method epitaxial growth YBCO superconductor layers. 

摘      要：We report the epitaxial growth of YBCO （YBa2Cu3O7） films on YSZ （Yttria-stabilized Zirconia） （100） substrates by chemical solution deposition. The precursor solution was prepared by dissolving stoichiometric amounts of acetates of Y（OOCCH3）3·4H2O, Ba（OOCCH3）2 and Cu（OOCCH3）·2H2O in an aqueous solution of oxalic acid （H2C2O4） and following the sol-gel route. This solution was directly dripped onto YSZ （100） substrates with the help of a Fisher pipette. To form the YBCO film, the sample was crystallized by annealing at 860 ℃ for 12 h in an oxidizing atmosphere. The characterization was performed by XRD （X-ray diffraction） analysis which revealed high intensity （001） reflections and denoted that most of the grains were c-axis oriented. Randomly oriented grains and other phases such as Y2BaCuO5 and CuO were also detected. The superconducting YBCO phase is demonstrated from the susceptibility versus temperature measurements which indicate a superconducting critical temperature ≈ 90 K. In addition, a surface morphology analysis was performed by optical microscopy and atomic force microscopy which revealed an average roughness of 0.2197 μm.