Imaging with a metamaterial ＂Im-Perfect＂ lens

作     者：J. O. Shenk M. A. Fiddy W. Yang 

作者机构：Center for Optoelectronics and Optical Communications University of North Carolina at Charlotte Charlotte NC 28223 USA Department of Engineering and Technology Western Carolina University CuUowheeN. C. 28779 USA 

出 版 物：《中国光学与应用光学》 (Chinese Optics and Applied Optics Abstracts)

年 卷 期：2010年第3卷第1期

页      面：45-51页

学科分类：0809[工学-电子科学与技术（可授工学、理学学位）] 07[理学] 070205[理学-凝聚态物理] 08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 0702[理学-物理学] 

基　　金：supported by DOE grant DE-FG02-ER64723 

主　　题：介电常数 渗透性 人造材料 散射度 

摘      要：There is widespread and strong interest in trying to fabricate a metamaterial in which both the permittivity and permeability are equal to -1 in order to achieve sub-wavelength imaging. Several metamaterial constructs have been proposed with varying degrees of success because of inherent losses, limited bandwidth and scattering from the abstracted circuit elements constituting the artificial material itself. A further limitation is the need to capture evanescent components from the object to be imaged that requires the lens to be located near the object. We have studied the underlying models and constraints that influence the design of a negative index lens and present this analysis as well as reviewing the opportunities. There are inevitable and well-known trade-offs between lens thickness, wavelength, dispersion and absorption. However, these can be characterized both numerically and experimentally, suggesting that a computational imaging approach to the recovery of sub-wavelength features might be effective. Depending on the specific details of the metamaterial employed for imaging, one can consider the data acquired to represent a set of coded apertures.