On-line full scan inspection of particle size and shape using digital image processing

作     者：Chih-Wei Liao Jiun-Hung Yu Yeong-Shin Tarng 

作者机构：Department of Mechanical Engineering National Taiwan University of Science and Technology Taipei 106 Taiwan China 

出 版 物：《Particuology》 (颗粒学报（英文版）)

年 卷 期：2010年第8卷第3期

页      面：286-292页

核心收录：

学科分类：0832[工学-食品科学与工程（可授工学、农学学位）] 08[工学] 080203[工学-机械设计及理论] 083202[工学-粮食、油脂及植物蛋白工程] 0802[工学-机械工程] 

主　　题：Particle size distribution Particle characterization Image analysis Line scan CCD Automatic inspection 

摘      要：An on-line full scan inspection system is developed for particle size analysis. A particle image is first obtained through optical line scan technology and is then analyzed using digital image processing. The system is composed of a particle separation module, an image acquisition module, an image processing module, and an electric control module. Experiments are carried out using non-uniform 0.1 mm particles. The main advantage of this system consists of a full analysis of particles without any overlap or miss, thus improving the Area Scan Charge Coupled Device （CCD） acquisition problems. Particle size distribution, roundness, and sphericity can be obtained using the system with a deviation of repeated precision of around ±1%. The developed system is shown to be also convenient and versatile for any particle size and shape for academic and industrial users.