Controlled buckling of thin film on elastomeric substrate in large deformation

作     者：C.Chen W.Tao Z.J.Liu Y.W.Zhang J.Song 

作者机构：Department of Mechanical and Aerospace EngineeringUniversity of MiamiCoral GablesFL 33146 Institute of Applied MechanicsZhejiang UniversityHangzhou 310027China Institute of High Performance Computing1 Fusionopolic Way#16-16 Connexis138632Singapore 

出 版 物：《Theoretical & Applied Mechanics Letters》 (力学快报(英文版))

年 卷 期：2011年第1卷第2期

页      面：8-11页

学科分类：07[理学] 070205[理学-凝聚态物理] 0831[工学-生物医学工程（可授工学、理学、医学学位）] 0830[工学-环境科学与工程（可授工学、理学、农学学位）] 0707[理学-海洋科学] 0815[工学-水利工程] 0805[工学-材料科学与工程（可授工学、理学学位）] 0813[工学-建筑学] 0802[工学-机械工程] 0824[工学-船舶与海洋工程] 0814[工学-土木工程] 0825[工学-航空宇航科学与技术] 0836[工学-生物工程] 0701[理学-数学] 0702[理学-物理学] 0801[工学-力学（可授工学、理学学位）] 

基　　金：supported by the Provost Award(University of Miami) the Ralph E.Powe Junior Faculty Enhancement Award(ORA U) NSF(Grant No.OISE1043161) NSFC(Grant No.10972194) 

主　　题：thin film buckling large deformation 

摘      要：Electronic systems with large stretchability have many applications.A precisely controlled buckling strategy to increase the stretchability has been demonstrated by combining lithographically patterned surface bonding chemistry and a buckling process.The buckled geometry was assumed to have a sinusoidal form,which may result in errors to determine the strains in the film.A theoretical model is presented in this letter to study the mechanics of this type of thin film/substrate system by discarding the assumption of sinusoidal buckling geometry.It is shown that the previous model overestimates the deflection and curvature in the thin film.The results from the model agree well with finite element simulations and therefore provide design guidelines in many applications ranging from stretchable electronics to micro/nano scale surface patterning and precision metrology.