ANALYSIS OF TEMPERATURE DEPENDENCE OF PHASES AND SURFACE MORPHOLOGY OF Bi_2Sr_2Ca_(x-1)Cu_xO_y THIN FILMS USING REACTIVE CO-DEPOSITION METHOD
ANALYSIS OF TEMPERATURE DEPENDENCE OF PHASES AND SURFACE MORPHOLOGY OF Bi_2Sr_2Ca_(x-1)Cu_xO_y THIN FILMS USING REACTIVE CO-DEPOSITION METHOD作者机构:School of Science Northeastern University Shenyang 110004 China
出 版 物:《Acta Metallurgica Sinica(English Letters)》 (金属学报(英文版))
年 卷 期:2007年第20卷第3期
页 面:199-204页
核心收录:
学科分类:0817[工学-化学工程与技术] 0806[工学-冶金工程] 08[工学] 0807[工学-动力工程及工程热物理] 0805[工学-材料科学与工程(可授工学、理学学位)] 080502[工学-材料学] 0802[工学-机械工程] 0703[理学-化学] 0811[工学-控制科学与工程]
主 题:Bi2212 (Bi2Sr2Cax-1CuxOy) single-phase dendritic growth substrate temperature
摘 要:A reactive co-deposition processing for obtaining high-quality single-phase Bi2Sr2Cax-1CuxOy (Bi2212) thin films has been investigated using molecular beam epitaxy (MBE) with 2.7 ×10^-3pa ozone gas introduction for oxidation. The thin films with a constant composition of almost 2 : 2 : 1 : 2 were designed to be fabricated at the substrate temperature between 675 and 780℃, the substrate temperature dependence of the surface morphology and the emergence phases were investigated in detail. A noticeable result is that the distribution of Cu element in the thin films is sensitively changed with the substrate temperature. At 750℃ it is inclined to locate in the periphery of each grain through the diffusion process. At 780℃ the Cu-compositional fluctuation brought around the dendritic crystal growth in the thin films. Below 705℃, the Bi2212 single-phase cannot be achieved in the thin films.