Detection of Graphene Cracks By Electromagnetic Induction,Insensitive to Doping Level

作     者：Taeshik Yoon Sumin Kang Tae Yeob Kang Taek-Soo Kim 

作者机构：Department of Mechanical EngineeringKAISTDaejeon 34141Korea Graphene Research CenterKAISTDaejeon 34141Korea 

出 版 物：《Computer Modeling in Engineering & Sciences》 (工程与科学中的计算机建模（英文）)

年 卷 期：2019年第120卷第8期

页      面：351-361页

核心收录：

学科分类：08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 0835[工学-软件工程] 0811[工学-控制科学与工程] 0701[理学-数学] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

基　　金：MOTIE/KEIT, (10044412) Ministry of Trade, Industry & Energy National Research Foundation Ministry of Trade, Industry and Energy, MOTIE, (20183010014470) Ministry of Science, ICT and Future Planning, MSIP Korea Institute of Energy Technology Evaluation and Planning, KETEP KAIST Wearable Platform Material Technology Center, WMC, (2016R1A5A1009926, 2018H1A2A1060140) 

主　　题：Graphene,crack detection inductance electromagnetic induction insensitive to doping 

摘      要：Detection of cracks is a great concern in production and operation processes of graphene based devices to ensure uniform ***,we show a detection method for graphene cracks by electromagnetic *** time varying magnetic field leads to induced voltage signals on graphene,and the signals are detected by a *** measured level of induced voltage is correlated with the number of cracks in graphene *** correlation is attributed to the increasing inductive characteristic of defective graphene,and it is verified by electromagnetic simulation and radio frequency ***,we demonstrate that the induced voltage signal is insensitive to the doping level of *** work can potentially lead to the development of a high-throughput and reliable crack inspection technique for mass production of graphene applications.