Effect of SPM Scanning Range on the Micromorphology Parameters
Effect of SPM Scanning Range on the Micromorphology Parameters作者机构:School of Materials Science and Engineering China University of Geosciences Beijing 100083 China
出 版 物:《International Journal of Minerals,Metallurgy and Materials》 (矿物冶金与材料学报(英文版))
年 卷 期:1998年第12卷第1期
页 面:36-38页
核心收录:
学科分类:0806[工学-冶金工程] 08[工学] 0818[工学-地质资源与地质工程] 0815[工学-水利工程] 0805[工学-材料科学与工程(可授工学、理学学位)] 080502[工学-材料学] 0813[工学-建筑学] 0703[理学-化学] 0802[工学-机械工程] 0814[工学-土木工程] 0801[工学-力学(可授工学、理学学位)] 0702[理学-物理学]
主 题:Scanning Probe Microscope(SPM) micromorphology micromorphology parameters
摘 要:The surface of a compact disk is analyzed by using SPM and the quantitative micromorphology analysissoftware SPMIAS developed by the author. Images at the same position but with different scanning ranges areobtained under the same experimental conditions. Micromorphology parameters are calculated and compared, andthe relationship between the changing of the scanning range and the changing of micromorphology parameters issummarized.