Effect of Ionic Content in Semiconductive Shield Materials on Breakdown Characteristics of Tree Retardant XLPE Power Cable

作     者：Pang Peter Miao Shawn Leung Simon Pang Peter;Miao Shawn;Leung Simon

作者机构：Dow Chemical (China) Co. Ltd. Shanghai 201203 China Dow Chemical Pacific Co. Ltd. Hong Kong China 

出 版 物：《高电压技术》 (High Voltage Engineering)

年 卷 期：2010年第36卷第8期

页      面：1912-1915页

核心收录：

学科分类：080801[工学-电机与电器] 0808[工学-电气工程] 08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 

主　　题：TR-XLPE semiconductive shield DL/T 1070 ionic contamination AC breakdown extend cable life 

摘      要：Cable made with Dow HFDA-0587 BK,HFDB-4202 EC, and HFDA-0693 BK was found to meet DL/T 1070-2007 requirement of tree retardant XLPE(TR-XLPE) power cable. The alternate-current breakdown(ACBD) value after 360 days of accelerated water treeing test(AWTT) was 29 kV/mm, which exceeds the DL/T 1070-2007 requirement of at least 20 kV/mm. Cable made with semiconductive shield materials from other material suppliers and HFDB-4202 EC, however, failed to meet DL/T 1070-2007 requirement of at least 20 kV/mm after 360 days of AWTT. This failure to meet DL/T 1070-2007 requirement, apparently, was caused by the high content of ionic contaminants and ash levels in the semiconductive shield materials. The results in this report suggest the use of clean semiconductive shield materials is necessary,in conjunction with tree retardant insulation material, for cables to meet the higher performance TR-XLPE DL/T 1070-2007 requirement, which will enhance system reliability by extending cable life, while lowering life cycle costs