Measurement and Simulation of Grain Size in Strong Textured and Coarse-Grained Metal Sheets

作     者：Leng CHEN Weimin MAO Yongning YU Huiping FENG 

作者机构：Department of Materials University of Science and Technology Beijing Beijing 100083 China Department of Materials University of Science and Technology Beijing Beijing 100083 China Department of Materials University of Science and Technology Beijing Beijing 100083 China Department of Materials University of Science and Technology Beijing Beijing 100083 China 

出 版 物：《Journal of Materials Science & Technology》 (材料科学技术（英文版）)

年 卷 期：2003年第19卷第Z1期

页      面：115-116页

核心收录：

学科分类：08[工学] 080502[工学-材料学] 0805[工学-材料科学与工程（可授工学、理学学位）] 

基　　金：This work was supported by the High-Tech Research and Development (863) Programme of China under grant No. 2001AA339030and the National Natural Science Foundation of China under grant No. 50171014 

主　　题：Grain size, Texture, Two-dimensional detectorLeng 

摘      要：An X-ray diffractometer that equipped with a two-dimensional detector is used for developing the technique of grainsize measurement for strong textured and coarse-grained Si steel sheet. The method is based on the concept thatthe position of diffraction spots depends on the orientation of individual grains. The two-dimensional detector hasthe ability to collect abundant diffraction information in seconds, thus it can be determined rapidly and accuratelywhether a series of diffraction spots come from the same grain. The experimental results show that this method canbe used for measuring grain size and its distribution in strong textured and coarse-grained metal sheets.