Structural and optical properties of Cr doped ZnO crystalline thin films deposited by reactive electron beam evaporation technique

作     者：Amjid Iqbal Arshad Mahmood Taj Muhammad Khan Ejaz Ahmed 

作者机构：National Institute of Laser and Optronics(NILOP)P.O.NiloreIslamabad 45650Pakistan Physics Division PINSTECHP.O.NiloreIslamabad 45650Pakistan 

出 版 物：《Progress in Natural Science:Materials International》 (自然科学进展·国际材料(英文))

年 卷 期：2013年第23卷第1期

页      面：64-69页

核心收录：

学科分类：080903[工学-微电子学与固体电子学] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 

基　　金：assistance from National Institute of Laser and Optronics (NILOP) Pakistan and Optics Laboratory Pakistan 

主　　题：Cr doping Thin film ZnO thin films Roughness Ellipsometry Optical constants 

摘      要：ZnO and Cr-doped ZnO thin films are grown on to glass substrates using reactive electron beam(e-beam) evaporation *** of structural,morphological,and optical properties with Cr doping is investigated.X-ray diffraction(XRD) studies show that the films are polycrystalline in nature with single *** dispersive spectroscopy(EDS) results demonstrate that Cr ions are substitutionally incorporated into *** force microscopy(AFM) reveals that the films present a compact surface and root mean squared(RMS) roughness increased with Cr *** optical band gap energy Eg of the films has been determined using Transmission data by spectrophotometer and *** band gap energy found to be decreased with increasing Cr doping *** optical constants(refractive index,extinction coefficient) are calculated using ellipsometry and found to increase with Cr doping concentration.