SOFTWARE TOOLS FOR ANALYZING NBTI-INDUCED DIGITAL CIRCUIT DEGRADATION
SOFTWARE TOOLS FOR ANALYZING NBTI-INDUCED DIGITAL CIRCUIT DEGRADATION作者机构:Department of Electronic Engineering Tsinghua University Beijing 100084 China TNList Tsinghua University Beijing 100084 China
出 版 物:《Journal of Electronics(China)》 (电子科学学刊(英文版))
年 卷 期:2009年第26卷第5期
页 面:715-719页
学科分类:0808[工学-电气工程] 0809[工学-电子科学与技术(可授工学、理学学位)] 080902[工学-电路与系统] 08[工学] 0835[工学-软件工程] 081202[工学-计算机软件与理论] 0812[工学-计算机科学与技术(可授工学、理学学位)]
基 金:Supported by the National Key Technological Program of China (No.2008ZX01035-001) the National Natural Sci-ence Foundation of China (No.60870001) TNList Cross-discipline Fundation
主 题:Integrated circuit Reliability Negative Biased Temperature Instability (NBTI) Software tool
摘 要:As semiconductor manufacturing migrates to more advanced technology nodes, accelerated aging effect for nanoscale devices poses as a key challenge for designers to find countermeasures that effectively mitigate the degradation and prolong system s lifetime. Negative Bias Temperature Instability (NBTI) is emerging as one of the major reliability concerns. Two software tools for NBTI analyzing are proposed in this paper, one for transistor-level, and the other for gate-level. The transistor-level can be used to estimate the delay degradation due to NBTI effect very accurately, while the gate-level can be used for repeat analysis in circuit optimization because of its fast computing speed.