SOFTWARE TOOLS FOR ANALYZING NBTI-INDUCED DIGITAL CIRCUIT DEGRADATION

作     者：Luo Hong Wang Yu Luo Rong Yang Huazhong Luo Hong Wang Yu Luo Rong Yang Huazhong (Department of Electronic Engineering, Tsinghua University, Beijing 100084, China) (TNList, Tsinghua University, Beijing 100084, China)

作者机构：Department of Electronic Engineering Tsinghua University Beijing 100084 China TNList Tsinghua University Beijing 100084 China 

出 版 物：《Journal of Electronics(China)》 (电子科学学刊（英文版）)

年 卷 期：2009年第26卷第5期

页      面：715-719页

学科分类：0808[工学-电气工程] 0809[工学-电子科学与技术（可授工学、理学学位）] 080902[工学-电路与系统] 08[工学] 0835[工学-软件工程] 081202[工学-计算机软件与理论] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

基　　金：Supported by the National Key Technological Program of China (No.2008ZX01035-001) the National Natural Sci-ence Foundation of China (No.60870001) TNList Cross-discipline Fundation 

主　　题：Integrated circuit Reliability Negative Biased Temperature Instability (NBTI) Software tool 

摘      要：As semiconductor manufacturing migrates to more advanced technology nodes, accelerated aging effect for nanoscale devices poses as a key challenge for designers to find countermeasures that effectively mitigate the degradation and prolong system s lifetime. Negative Bias Temperature Instability (NBTI) is emerging as one of the major reliability concerns. Two software tools for NBTI analyzing are proposed in this paper, one for transistor-level, and the other for gate-level. The transistor-level can be used to estimate the delay degradation due to NBTI effect very accurately, while the gate-level can be used for repeat analysis in circuit optimization because of its fast computing speed.