Influence of atomic force microscope(AFM) probe shape on adhesion force measured in humidity environment

作     者：阳丽 涂育松 谭惠丽 Li YANG;Yu-song TU;Hui-li TAN

作者机构：College of Physics Science and TechnologyGuangxi Normal University Institute of Systems BiologyShanghai University 

出 版 物：《Applied Mathematics and Mechanics(English Edition)》 (应用数学和力学（英文版）)

年 卷 期：2014年第35卷第5期

页      面：567-574页

核心收录：

学科分类：07[理学] 070203[理学-原子与分子物理] 0805[工学-材料科学与工程（可授工学、理学学位）] 0802[工学-机械工程] 0701[理学-数学] 0801[工学-力学（可授工学、理学学位）] 0702[理学-物理学] 

基　　金：Project supported by the National Natural Science Foundation of China(Nos.11105088 and 81060307) the Innovation Program of Shanghai Municipal Education Commission(No.11YZ20) the Guangxi Natural Science Foundation Program(No.2013GXNSFBA019006) the Guangxi Province Higher Educational Science and Technology Program(No.2013YB033) 

主　　题：capillary force van der Waals force adhesion force curvatures probe shape, 

摘      要：In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope （AFM） tips and substrate. The analysis shows that the precise tip geometry plays a critical role on humidity depen- dence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt （paraboloid） tip, the adhesion force versus humidity curves tends to the apparent contrast （peak-to-valley corrugation） with a broad range. This paper demonstrates that the abrupt change of the adhesion force has high correla- tion with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines （triple point） on the probe profiles. The study provides insights for further under- standing nanoscale adhesion forces and the way to choose probe shapes in manipulating micro-objects in AFM experiments.