Improving metal reflectors by suppressing surface plasmon polaritons: a priori calculation of the internal reflectance of a solar cell
作者机构:Swiss Federal Institute of TechnologyLausanne(EPFL)Institute of Microengineering(IMT)Photovoltaics and Thin-Film Electronics LaboratoryCH-2000 NeuchaˆtelSwitzerland
出 版 物:《Light(Science & Applications)》 (光(科学与应用)(英文版))
年 卷 期:2013年第2卷第1期
页 面:32-37页
核心收录:
学科分类:0808[工学-电气工程] 0809[工学-电子科学与技术(可授工学、理学学位)] 08[工学] 0805[工学-材料科学与工程(可授工学、理学学位)] 080502[工学-材料学] 0702[理学-物理学]
基 金:This work was supported by the European Union Seventh Framework Programme(FP7/2007-2013) Collaborative Project‘20plms’with the full title:‘Further development of very thin wafer based c-Si photovoltaics’under grant agreement no.256695 by Axpo Naturstrom Fonds,Switzerland,and by the Swiss Commission for Technology and Innovation
主 题:light trapping photovoltaics plasmon silicon solar cell
摘 要:Imperfect internal reflectance of near-bandgap light reduces the performance of all solar cells,and becomes increasingly detrimental as absorbers become *** consider light incident on the silicon/dielectric/metal structure at the back of rear-passivated crystalline silicon solar cells with surface textures that are large enough for geometric *** calculating the absorbance in the metal as a function of the angle of incidence,we discover three results that are important for understanding and improving rear reflectors in many types of solar ***,significant parasitic absorption occurs in the metal layer in two cases:s-and p-polarized propagating modes(near-normal angles of incidence)when the dielectric thickness is adjusted to cause destructive interference of the reflected beams,and p-polarized evanescent modes(angles of incidence above the semiconductor/dielectric critical angle)that excite surface plasmon polaritons at the metal ***,the latter loss dominates;a well-designed rear dielectric passivation layer must suppress the penetration of evanescent waves to the ***,when used as an input in a simple analytical model,the average rear internal reflectance calculated by assuming a Lambertian angular distribution of light accurately predicts the total reflectance and absorbance of a solar cell.