Imaging of Mica and Graphite Surfaces With the Laser-AFM

作     者：吴浚瀚 成英俊 戴长春 黄桂珍 谢有畅 龚立三 白春礼 

作者机构：Molecular Biotech Research Center South China Normal University Guangzhou 510631 PRC. Lab of STM Institute of Chemistry Academia Sinica Beijing 100080. PRC. Department of Chemistry Peking University Beijing 100871 PRC. Lab of STM Institute of Chemistry Academia Sinica Beijing 100080 PRC. 

出 版 物：《Chinese Science Bulletin》 (科学通报(英文版))

年 卷 期：1993年第38卷第19期

页      面：1621-1622页

核心收录：

学科分类：07[理学] 08[工学] 

基　　金：Project supported by Academia Sinica 

主　　题：mica graphite surface laser AFM. 

摘      要：In 1986, Binnig et al. developed the first atomic force microscope (AFM). The AFM, unlike the scanning tunnelling microscope (STM), has no demands for electrical conductivity, so it has been used in science and technology more widely. In 1988, the AFM was improved, and the AFM employing laser beam deflection for force detection (laser-AFM) was developed. In 1990, laser-AFM got the atomic-resolution. Up till now, the AFM has developed into a very important technique for studying the surface.