Target-Fault-Oriented Test Generation of Sequential CircuitsUsing Genetic Algorithm

作     者：Li Shen Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China, 100080 

出 版 物：《湖南大学学报（自然科学版）》 (Journal of Hunan University:Natural Sciences)

年 卷 期：2000年第27卷第S2期

页      面：95-103页

核心收录：

学科分类：080903[工学-微电子学与固体电子学] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

主　　题：target-fault-oriented test generation genetic algorithm test generati( 

摘      要：This paper deals with the target-fault-oriented test generation of sequential circuits using genetic algorithms. We adopted the concept of multiple phases and proposed four sub-procedures which consist of activation, propagation and justification phases. The paper focuses on the design of genetic operators and construction of fitness functions which are based on the structure information of circuits. Using ISCAS89 benchmarks, the experiment results of GA were given.