Primary study of the isothermal phase diagram of the Cu_2O-Al_2O_3-SiO_2 ternary system at 1150℃ in air

作     者：XIAO Qiuguo ZHAO Xinhua HUANG Ling DENG Xuebin 

作者机构：Department of Chemistry Beijing Normal University Beijing 100875 China College of Chemistry and Chemical Engineering Hunan University of Science and Technology Xiangtan 411201 China 

出 版 物：《Rare Metals》 (稀有金属（英文版）)

年 卷 期：2007年第26卷第5期

页      面：515-520页

核心收录：

学科分类：08[工学] 080502[工学-材料学] 0805[工学-材料科学与工程（可授工学、理学学位）] 

基　　金：the National Natural Science Foundation of China (No. 20471010) the Scien-tific Research Fund of Hunan Provincial Education Department (No. 05c173) 

主　　题：material experiment isothermal phase diagram X-ray diffraction Cu2O-Al2O3-SiO2 system 

摘      要：The isothermal phase diagram of the Cu2O-Al2O3-SiO2 ternary system at 1150℃ was reported for the samples which were prepared from sol-gel method and quenched by water after being heated at 1150℃ for 12 h. Based on the conventional X-ray powder diffraction （XRD） and in situ high-temperature XRD quantitative analysis,in addition to scanning electron microscopy measurement,the phase identification was achieved. Combining the deduction from the component phase diagrams of the binary systems using the phase equilibrium theorem,the primary isothermal phase diagram was plotted over the composition area Cu2O-mullite-SiO2. In this area,the approximate composition areas of two two-phase regions and one three-phase region,（L2＋Cr）,（L2＋M）,and （L1＋L2＋Tr）,were determined. Moreover,the precise composition areas of both of the three-phase regions （L2＋Cr＋M） and （L2＋M＋A） were determined according to the results of conventional and in situ high-temperature XRD quantitative analysis by Rietveld method.