Characterization of yttria-stabilized zirconia films deposited by dip-coating on La_(0.7)Sr_(0.3)MnO_(3) substrate:Influence of synthesis parameters

作     者：Jacqueline C.MARRERO Nielson F.P.RIBEIRO Célia F.MALFATTI Mariana M.V.M.SOUZA 

作者机构：Escola de Química-Universidade Federal do Rio de Janeiro(UFRJ)Centro de TecnologiaBloco Esala 206Ilha do FundãoCEP 21941-909Rio de JaneiroRJBrazil Departamento de MetalurgiaUniversidade Federal do Rio Grande do Sul(UFRGS)Campus do ValeSetor 4Prédio 75Sala 234CEP 91501-970Porto AlegreRSBrazil 

出 版 物：《Journal of Advanced Ceramics》 (先进陶瓷（英文）)

年 卷 期：2013年第2卷第1期

页      面：55-62页

核心收录：

学科分类：0808[工学-电气工程] 0809[工学-电子科学与技术（可授工学、理学学位）] 0817[工学-化学工程与技术] 08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 0702[理学-物理学] 

基　　金：The authors thank CAPES for financial support to carry out this work 

主　　题：YSZ films LSM sol-gel dip-coating 

摘      要：Yttria-stabilized zirconia(YSZ,ZrO_(2)-8%Y2O_(3))films were deposited onto lanthanum strontium manganite(LSM,La_(0.7)Sr_(0.3)MnO_(3))substrates using dip-coating process aiming for the application in solid oxide fuel cells(SOFCs).YSZ precursor was prepared by sol-gel method;three values of the organic/inorganic concentration ratio(1,3 and 5)were utilized and the sol viscosity was adjusted(60 mPa·s and 100 mPa·s)before deposition on the *** influence of these synthesis parameters on the structure and morphology of the deposited films was examined by X-ray diffraction(XRD)and scanning electron microscopy(SEM).The films showed characteristic peaks of LSM,YSZ(with cubic structure)and secondary phases of SrZrO_(3) and La_(2)O_(3).Depending on the synthesis conditions,crack-free,homogeneous and well adhered films were obtained,with thickness of 11-24μm.