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Identification and characterization of single crystal Bi_(2)Te_(3-x)Se_(x) alloy

单晶Bi_(2)Te_(3-x)Se_(x)合金的鉴定与表征(英文)

作     者:Emina POZEGA Svetlana IVANOV Zoran STEVIC Ljiljana KARANOVIC Rudolf TOMANEC Lidija GOMIDZELOVIC Ana KOSTOV Emina POEGA;Svetlana IVANOV;Zoran STEVI;Ljiljana KARANOVI;Rudolf TOMANEC;Lidija GOMIDELOVI;Ana KOSTOV

作者机构:Mining and Metallurgy Institute Bor Technical Faculty BorUniversity of Belgrade Faculty of Mining and GeologyUniversity of Belgrade 

出 版 物:《Transactions of Nonferrous Metals Society of China》 (中国有色金属学报(英文版))

年 卷 期:2015年第25卷第10期

页      面:3279-3285页

核心收录:

学科分类:08[工学] 080502[工学-材料学] 0805[工学-材料科学与工程(可授工学、理学学位)] 

基  金:"Development of ecological knowledge-based advanced materials and technologies for multifunctional application" (Grant No.TR34005) "New approach to designing materials for energy conversion and storage" (Grant No.OI172060) "0-3D nanostructures for application in electronics and renewable energy sources:synthesis,characterisation and processing" (Grant No.III45007) 

主  题:Bi_(2)Te_(3) Bi_(2)Te_(3-x)Se_(x) single crystal semiconductor thermoelectrical properties hardness thermovision imaging 

摘      要:The results of experimental investigation of n-type semiconductor based on Bi2Te3 alloy were presented. This material is used in manufacture of thermoelectric coolers and electrical power generation devices. BizTe2.88Se0.12 solid solution single crystal has been grown using the Czochralski method. Monitoring of structure changes of the sample was carried out by electron microscope. The elemental composition of the studied alloy was obtained by energy dispersive spectrometry (EDS) analysis and empirical formula of the compound was established. X-ray diffraction analysis confirmed that the Bi2Te2.88Se0.12 sample was a single phase with rhombohedral structure. The behavior upon heating was studied using differential thermal analysis (DTA) technique. Changes in physical and chemical properties of materials were measured as a function of increasing temperature by thermogravimetric analysis (TGA). The lattice parameters values obtained by X-ray powder diffraction analyses of Bi2Te2.88Se0.12 are very similar to BizTe3 lattice constants, indicating that a small portion of tellurium is replaced with selenium. The obtained values for specific electrical and thermal conductivities are in correlation with available literature data. The Vickers microhardness values are in range between HV 187 and HV 39.02 and decrease with load increasing. It is shown that very complex process of infrared thermography can be applied for characterization of thermoelectric elements and modules.

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