A Neural-based L1-Norm Optimization Approach for Fault Diagnosis of Nonlinear Resistive Circuits

作     者：Yigang He School of Electrical & Information Engineering, Hunan Univ,Changsha 410082,P.R.China Yichuang Sun Department of Electronic,Communication & electrical Engineering,Faculty of Engineering and Information Sciences,University of Hertfordshire,Hatfie 

出 版 物：《湖南大学学报（自然科学版）》 (Journal of Hunan University:Natural Sciences)

年 卷 期：2000年第27卷第S2期

页      面：143-147页

核心收录：

学科分类：080902[工学-电路与系统] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

主　　题：Fault diagnosis Neural networks Optimization methods Nonlinear circuits Anlog circuits 

摘      要：This paper deals with fault isolation in nonlinear analog circuits with tolerance under an insufficient number of independent voltage measurements.A neural network-based L1-norm optimization approach is proposed and utilized in locating the most likely faulty elements in nonlinear *** validity of the proposed method is verified by both extensive computer simulations and practical *** simulation example is presented in the paper.