Structural and magnetic properties of La_(0.7)Sr_(0.3)MnO_(3) ferromagnetic thin film grown on PMN-PT by sol-gel method

作     者：Jing Zhang Peng Shi Mingmin Zhu Ming Liu Wei Ren Zuoguang Ye 

作者机构：Electronic Materials Research Laboratory Key Laboratory of the Ministry of Education and International Center for Dielectric Research Xi'an Jiaotong UniversityXi'an 710049P.R.China Department of Chemistry and 4D LABSSimon Fraser University BurnabyBC V5A 1S6Canada 

出 版 物：《Journal of Advanced Dielectrics》 (先进电介质学报（英文）)

年 卷 期：2017年第7卷第4期

页      面：47-50页

学科分类：0809[工学-电子科学与技术（可授工学、理学学位）] 07[理学] 070205[理学-凝聚态物理] 08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 0702[理学-物理学] 

基　　金：financially supported by International Science&Technology Cooperation Program of China(Grant no.2011DFA51880) 111 Project of China(B14040) 

主　　题：La_(0.7)Sr_(0.3)MnO_(3)thin films PMN-PT sol-gel method magnetoresistance 

摘      要：We report the preparation of epitaxial La_(0.7)Sr_(0.3)MnO_(3) thin films grown on(001)-oriented 0.72Pb(Mg_(1/3)Nb_(2/3))TO_(3)-0.28PbTiO_(3) substrates by the sol–gel *** phase structure,magnetic properties and magnetoresistance of the samples are investigated by using high solution X-ray diffraction,atomic force microscopy,physical property measurement system,*** La_(0.7)Sr_(0.3)MnO_(3) thin films display a well-defined hysteresis loop and typical ferromagnetism behavior at lower *** magnetoresistance at 5 T of 42%appears at 227K for La_(0.7)Sr_(0.3)MnO_(3) thin film.