Investigation of C_(60) Single Crystal by X-Ray Methods

作     者：LI Chaorong MAI Zhenhong WANG Gang WANG Yutian WU Lansheng CUI Shufan XIE Sishen JIANG Jianhua 

作者机构：Institute of PhysicsAcademia SinicaBeijing 100080 Institute of SemiconductorsAcademia SinicaBeijing 100083 Beijing Synchrotron Radiation LaboratoryP.O.Box 918Beijing 100039 

出 版 物：《Chinese Physics Letters》 (中国物理快报（英文版）)

年 卷 期：1995年第12卷第4期

页      面：217-220页

核心收录：

学科分类：08[工学] 080502[工学-材料学] 0805[工学-材料科学与工程（可授工学、理学学位）] 

基　　金：Supported by BSRF BEPC the Chinese National Committee of Science and Technology 

主　　题：cubic topography crystal 

摘      要：C_(60) single crystals grown by a single-temperature-gradient technique were characterized by synchrotron radiation white beam x-ray topography and x-ray double crystal diffraction with Cu K_(α1) radiation on conventional x-ray *** results show that the crystal is rather well *** x-ray topographies give an evidence of dendritic growth mechanism of C_(60) single crystal,and x-ray double crystal diffraction rocking curve shows that there are mosaic structural defects in the sample.A phase transition at 249±1.5K from a simple cubic to a face centered cubic structure is confirmed by in situ observation of synchrotron radiation white beam x-ray topography with the temperature varing from 230 to 295K.