Ni-B Nanometer Particles Observed by Scanning Tunneling Microscopy
作者机构:T.D.Lee Physics LaboratoryFudan UniversityShanghai 200433 Department of Materials ScienceFudan UniversityShanghai 200433 Department of ChemistryFudan UniversityShanghai 200433
出 版 物:《Chinese Physics Letters》 (中国物理快报(英文版))
年 卷 期:1994年第11卷第9期
页 面:561-564页
核心收录:
学科分类:08[工学] 0805[工学-材料科学与工程(可授工学、理学学位)] 080502[工学-材料学]
主 题:mechanism. particle disperse
摘 要:The samples of the Ni-B nanometer particles which were suitable for scanning tunneling microscopy(STM)have been prepared and *** experimental results suggest that the vertical height of the nanometer particles imaged by the STM has strongly related to the method of the sample *** the Ni-B nanometer particle the water and impurity layer adsorbed to the particle surface played an important role in the conduction *** last alcohol can be used as a tool to disperse the nanometer particles on the highly oriented pyrolytic graphite support.