NOVEL SEMICONDUCTOR SUBSTRATE FORMED BY HYDROGEN ION IMPLANTATION INTO SILICON
作者机构:Institute of SemiconductorsAcademia SinicaBeijing
出 版 物:《Chinese Physics Letters》 (中国物理快报(英文版))
年 卷 期:1989年第6卷第10期
页 面:458-460页
核心收录:
学科分类:08[工学] 080502[工学-材料学] 0805[工学-材料科学与工程(可授工学、理学学位)]
主 题:implantation realization beneath
摘 要:A high resistivity layer formed beneath the silicon surface by using protons implantation and two-step annealing is *** shows that the surface Hall mobility of top layer has increased by 26%・This novel substrate challenges to GaAs(advantages of speed)and opens a new road for the realization of very high speed integrated circuits.