Characterization of CIAE developed double-sided silicon strip detector for charged particles
Characterization of CIAE developed double-sided silicon strip detector for charged particles作者机构:China Institute of Atomic EnergyBeijing 102413China Department of PhysicsThe University of Hong KongPokfulam RoadHong KongChina College of Physics and TechnologyGuangxi Normal UniversityGuilin 541004China Beijing Kelixing Photoelectric Technology Co.Ltd.Beijing 102413China
出 版 物:《Nuclear Science and Techniques》 (核技术(英文))
年 卷 期:2018年第29卷第5期
页 面:98-103页
核心收录:
学科分类:08[工学] 0827[工学-核科学与技术]
基 金:supported by the National Natural Science Foundation of China(Nos.U1432246,U1632136,U1432127,11375268,11635015,and 11475263) the National Basic Research Program of China(No.2013CB834404)
主 题:Double-sided silicon strip detector P-stop Detection performance Cross talk
摘 要:A double-sided silicon strip detector(DSSD)with active area of 48 mm x 48 mm and thickness of300μm has been developed. Each side of DSSD consists of48 strips, each with width of 0.9 mm and inter-strip separation of 0.1 mm. Electrical properties and detection performances including full depletion bias voltage, reverse leakage current, rise time, energy resolution and cross talk have been studied. At a bias of 80 V, leakage current in each strip is less than 15 nA, and rise time for alpha particle at 5157 keV is approximately 15 ns on both *** energy resolutions have been achieved with0.65-0.80% for the junction strips and 0.85-1.00% for the ohmic strips. The cross talk is found to be negligible on both sides. The overall good performance of DSSD indicates its readiness for various nuclear physics experiments.