Determination of the specific shunt resistances under and away from the front contacts of solar cell

作     者：ZHANG LuCheng SHEN Hui 

作者机构：Institute for Solar Energy SystemsSun Yat-sen UniversityGuangzhou 510006China 

出 版 物：《Science China(Technological Sciences)》 (中国科学（技术科学英文版）)

年 卷 期：2009年第52卷第10期

页      面：3082-3084页

核心收录：

学科分类：0810[工学-信息与通信工程] 08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 0702[理学-物理学] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

基　　金：Supported by the Ph.D. Programs Foundation of Ministry of Education of China (Grant No. 4111283) 

主　　题：silicon solar cell contact shunt characterization 

摘      要：New structure of front contacts was devised and fabricated for accurately measuring the resistances under and away from the front contacts of silicon solar cell with the results showing that the former was much worse. The sample preparing sequence was completely compatible with the conventional solar cell manufacturing process, which demonstrated the convenience of this approach. With the aid of this characterization technique, detailed information can be obtained on the solar cell structure, material ingredients and process parameters, especially the sintering process.