Design of TE_(01δ) Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film

作     者：Cheng Zeng Zheng-Xiang Luo Qi-Shao Zhang Kai Yang 

作者机构：School of Optoelectronic Information University of Electronic Science and Technology of China Chengdu 610054 China 

出 版 物：《Journal of Electronic Science and Technology of China》 (中国电子科技（英文版）)

年 卷 期：2008年第6卷第2期

页      面：212-215页

学科分类：080801[工学-电机与电器] 0808[工学-电气工程] 08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 

基　　金：This work was supported by the National 863 Foundation of China under Grant No. TC265-C304 

主　　题：High temperature superconductor,surface resistance surface resistance measurement. 

摘      要：A new TEo1δ test probe with proper transmission factor is fabricated for the measurement of surface resistance of high temperature superconductor （HTS） thin film. Coupling holes instead of coupling loops are used in the probe for its easier machining and relatively low loss. Two 6 mm × 3 mm × 8 mm dielectric waveguides, one side of them is coated by silver, are used for coupling. The measurement result of S21 agrees well with the simulation because the size of the probe can be rigidly controlled by machine. The microwave surface resistance of four YBCO/MgO films are measured at 77 K and 12 GHz and scaled to 10 GHz according to thef2 rule. The average surface resistance of four HTS thin fdms is 0.38 mΩ, the standard deviation and relative standard deviation of one single HTS thin film are 0.009 mΩ and 2.4%, respectively.