86% TMR at 4.2 K for Amorphous Magnetic-Tunnel-Junctions with Co_(60)Fe_(20)B_(20) as Free and Pinned Layers
86% TMR at 4.2 K for Amorphous Magnetic-Tunnel-Junctions with Co_(60)Fe_(20)B_(20) as Free and Pinned Layers作者机构:State Key Laboratory of Magnetism Beijing National Laboratory for Condensed Matter Physics Institute of Physics Chinese Academy of Sciences Beijing 100080 China
出 版 物:《Journal of Materials Science & Technology》 (材料科学技术(英文版))
年 卷 期:2005年第21卷第3期
页 面:289-291页
核心收录:
学科分类:08[工学] 0805[工学-材料科学与工程(可授工学、理学学位)] 080502[工学-材料学]
基 金:Project supported by the State Key Project of Fundamen-tal Research of Ministry of Science and Technology(MOST,China,Grant No.2001CB610601) Chinese Academy of Science.X.F.Han gratefully thanks the partial support of the National Natural Science Foundation of China(50271081 and 10274103) Distinct Young Researcher Foundation(50325104)
主 题:Tunnel magnetoresistance Magnetic tunnel junction Spin-polarization MRAM Co60Fe20B20
摘 要:Single barrier magnetic-tunnel-junctions (MTJs) with the layer structure of Ta(5)/Cu(30)/Ta(5)/Ni79Fe21(5)/Ir22 Mn78(12)/Co60Fe20B20(4)/Al(0.8)-oxide/Co60Fe20B20(4)/Cu(30)/Ta(5) [thickness unit: nm] using the amorphous Co60Fe20B20 alloy as free and pinned layers were micro-fabricated. The experimental investigations showed that the tunnel magnetoresistance (TMR) ratio and the resistance decrease with increasing dc bias voltage from 0 to 500 mV or with increasing temperature from 4.2 K to RT. A high TMR ratio of 86.2% at 4.2 K, which corresponds to the high spin polarization of Co60Fe20B20, 55%, was observed in the MTJs after annealing at 270℃ for 1 h. High TMR ratio of 53.1%, low junction resistance-area product RS of 3.56 kΩμm2, small coercivity HC of ≤4 Oe, and relatively large bias-voltage-at-half-maximum TMR with the value V1/2 of greater than 570 mV at RT have been achieved in such Co-Fe-B MTJs.