A DEVELOPED FULL-FIELD FEM ANALYSIS COMBINED WITH ESPI FOR THE INVESTIGATION OF DEFECT EVOLUTION IN POLYMER FILMS

作     者：Xiao-fang Liu Shuai-xia Tan Xiao-li Zhang 赵宁 徐坚 

作者机构：Beijing National Laboratory of Molecular ScienceLaboratory of Polymer Physics and ChemistryInstitute of ChemistryChinese Academy of Sciences Graduate University of the Chinese Academy of Sciences 

出 版 物：《Chinese Journal of Polymer Science》 (高分子科学（英文版）)

年 卷 期：2013年第31卷第7期

页      面：1022-1028页

核心收录：

学科分类：07[理学] 08[工学] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程（可授工学、理学学位）] 070102[理学-计算数学] 0701[理学-数学] 

基　　金：financially supported by NSFC (No. 201121001) 

主　　题：Electronic speckle pattern interferometry Finite element method Defect In-plane displacement Polymer film. 

摘      要：A full-field finite element method （FEM） analysis combined with electronic speckle pattern interferometry （ESPI） measurement was developed to investigate defect evolution in polymer films. Different from the previous reports, which only compare the ESPI experimental and FEM simulated results at several points or lines, herein the full-field FEM results were exported, subtracted with a continuous distribution. By choosing proper parameters and number of substeps, the simulated and experimental results showed excellent correspondence. Furthermore, the displacement fields vertical to the tensional direction were also presented, and the strain field was preliminarily evaluated. The current method of combination of ESPI and FEM allows for capturing the experimental fringe maps to validate and optimize FEM results simulated, and would give a higher security to structural and mechanical analysis of polymeric materials.