Tensile-WAXD Apparatus:An Improved and Accurate System for the In situ Study of Extension-induced Segmental Orientation in Highly Stretched Elastomer

作     者：Xiang Shi Xiang Shi

作者机构：Center for Advanced Material Diagnostic TechnologyShenzhen Technology UniversityShenzhen518118China Laboratoire de Physique des SolidesCNRSUniversitéParis-SudUniversitéParis-SaclayOrsay91400France 

出 版 物：《Chinese Journal of Polymer Science》 (高分子科学（英文版）)

年 卷 期：2024年第42卷第12期

页      面：2002-2010,I0011页

核心收录：

学科分类：08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 

基　　金：financial support of China CSC Scholarship(No.201604910522) 

主　　题：X-ray apparatus Elongation calculation Segmental orientation In situ measurement 

摘      要：An improved X-ray apparatus that combines tensile testing and X-ray diffraction has been designed and constructed to conduct timeresolved experiments during uniaxial *** utilizing mortise-like clamping jaws and dogbone-shaped specimens,this setup allows for the simultaneous recording of high-quality mechanical responses and 2D diffraction patterns due to the minimization of experimental errors from sample slippage or premature ***,the local extension ratio can be accurately determined based on thickness variation,and the Hermans orientation function was demonstrated to be a reliable method with high accuracy to calculate the segmental orientation parameter〈P_(2)〉in elastomeric samples under high degree of *** summary,this innovative tensile-WAXD instrument has proven to be a promising and powerful technique for investigating the“stress-deformation-segmental orientationrelationship in elastomers with high extensibilities.