Low temperature testing and neutron irradiation of a swept charge device on board the HXMT satellite
Low temperature testing and neutron irradiation of a swept charge device on board the HXMT satellite作者机构:Key Laboratory for Particle Astrophysics Institute of High Energy Physics Chinese Academy of Sciences (CAS) College of Physics Jilin University School of Physical Science and TechnologyYunnan University Beijing University of Chemical Technology
出 版 物:《Chinese Physics C》 (中国物理C(英文版))
年 卷 期:2012年第36卷第10期
页 面:991-995页
核心收录:
学科分类:0709[理学-地质学] 08[工学] 0708[理学-地球物理学] 0804[工学-仪器科学与技术] 0827[工学-核科学与技术] 0703[理学-化学] 0704[理学-天文学] 0702[理学-物理学]
主 题:SCD HXMT energy resolution readout noise neutron irradiation
摘 要:We present the low temperature testing of an SCD detector, investigating its performance such as readout noise, energy resolution at 5.9 keV and dark current. The SCD’s performance is closely related to temperature, and the temperature range of 80℃ to 50℃ is the best choice, where the FWHM at 5.9 keV is about 130 eV. The influence of the neutron irradiation from an electrostatic accelerator with fluence up to 1 × 109 cm-2 has been examined. We find the SCD is not vulnerable to neutron irradiation. The detailed operations of the SCD and the test results of low temperature are reported, and the results of neutron irradiation are discussed.