Nano-ZnO film preparation at low temperature and the optical indices calculation

作     者：杨爱玲 包西昌 李顺嫔 阳仁强 王婷 王玉金 孙亮 

作者机构：Department of PhysicsOcean University of China Qingdao Institute of Bioenergy & Bioprocess TechnologyChinese Academy of Sciences 

出 版 物：《Optoelectronics Letters》 (光电子快报（英文版）)

年 卷 期：2014年第10卷第3期

页      面：216-220页

核心收录：

学科分类：080903[工学-微电子学与固体电子学] 080503[工学-材料加工工程] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 0802[工学-机械工程] 080201[工学-机械制造及其自动化] 

基　　金：supported by the National Natural Science Foundation of China(Nos.41172110 and 61107090) Shandong Provincial Natural Science Foundation(No.ZR2011BZ007) 

主　　题：纳米ZnO薄膜 低温退火 计算结果 膜制剂 光学 正常色散 折射率 吸收边 

摘      要：The refractive indices of thin films based on Kramers-Kronig theory are *** the correction theory is used to determine the optical indices of nano-ZnO thin films prepared by low temperature sol-gel *** calculated results indicate that in the visible(Vis) range,the refractive indices of nano-ZnO thin films exhibit a slight abnormal dispersion,while in the ultraviolet(UV) region,the refractive indices increase with wavelengths increasing(normal dispersion).But the refractive indices show complex change near the absorption *** maximum refractive index(1.95) of nano-ZnO thin films within UV range at low temperature annealing is much lower than that of the films annealed at high *** absorption and refractive indices are closely related to the defects in nano-ZnO thin films.