Optimization and degradation of rubrene/C_(70) heterojunction solar cells

作     者：陈子国 刘彭义 侯林涛 麦文杰 吴冰 

作者机构：Department of PhysicsJinan University Siyuan Lab.Jinan University 

出 版 物：《Optoelectronics Letters》 (光电子快报（英文版）)

年 卷 期：2012年第8卷第2期

页      面：93-96页

核心收录：

学科分类：080903[工学-微电子学与固体电子学] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 080501[工学-材料物理与化学] 080502[工学-材料学] 0805[工学-材料科学与工程（可授工学、理学学位）] 

基　　金：supported by the Natural Science Foundation of Guangdong Province of China (No.06025173) 

主　　题：Conversion efficiency Electric resistance Heterojunctions Indium compounds Molybdenum oxide Open circuit voltage Tin Tin oxides 

摘      要：Small molecule organic solar cells （OSCs） with the structure of indium tin oxide （1TO）/molybdenum trioxide （MOO3） （5 nm）/rubrene （x nm）/fullerene （C70） （y nm）/2, 9-dimethyl-4, 7-diphenyl-1, 10-phenanthroline （BCP） （6 nm）/aluminum （A1） （150 nm） are fabricated. The thickness of active layer for the devices is investigated in details. The results show that the optimum thicknesses of rubrene layer and C70 layer are 30 nm and 25 nm, respectively. The degradation of the device is also investigated. The result indicates that the open-circuit voltage （Voo） does not change, while the short-circuit current density （Jsc）, fill factor （FF） and power conversion efficiency （PCE） decrease continuously with time. The degradation can be attributed to the oxygen in ambient diffusing and infiltrating into the active materials and reacting with C70 in cells, which can result in the increase of interfacial series resistance.