A method for determining the complex refractive index dispersion of absorbing materials without thickness information
作者机构：School of Physics and TEDA Applied Physics Key Laboratory of Weak-Light Nonlinear Photonics Ministry of Education Nankai University
出 版 物：《Optoelectronics Letters》 (光电子快报(英文))
年 卷 期：2024年
学科分类：08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学]
基 金：supported by National Key R&D Program of China (2021YFC2401401)
摘 要：The complex refractive index dispersion (CRID) of absorbing materials is very important in many fields， especially in printing industry and medical research. However， due to their strong absorbing， CRID determination is still a challenge. In this study， without diluting treatment or the thickness information， a method is proposed to calculate the CRID of absorbing materials， based merely on the reflectance and transmittance spectra measurements. The method separates the CRID into absorbing part and transparent part based on Kramers-Kronig relations， and it also uses the common Cauchy dispersion formula and Fresnel reflection formula. The CRID of methyl-red-doped poly (methyl methacrylate) (3% mass fraction) and hemoglobin solutions (320g/L) are determined over the spectral range from 400nm to 750 nm， and the result shows good stability and consistency of the method.
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